Incorporating the direct derivation method and molecular scattering power method into the Rietveld quantitative phase analysis routine in TOPAS

Wang, X.; Spratt, H.

doi:10.1107/S1600576725004054

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Equation (19) of the MSP method implemented in TOPAS (a) Launch Mode and b) GUI Mode, to quantify a phase of unknown lattice parameters.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 4| August 2025| Pages 1159-1173

https://doi.org/10.1107/S1600576725004054

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