High-energy diffuse X-ray scattering at ultra-small-angle grazing incidence for local structure study of single-crystalline thin films

Bang, J.; Strkalj, N.; Sarott, M.F.; Kholina, Y.; Trassin, M.; Weber, T.

doi:10.1107/S1600576725005837

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Schematic diagram of the ME-GID setup on the BM01 beamline at ESRF and the HE-GID setup on the P07 beamline at PETRA III, DESY. The ϕ axis is horizontal on BM01 and vertical on P07.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 4| August 2025| Pages 1417-1427

https://doi.org/10.1107/S1600576725005837

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