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Figure 3
(a) Reconstruction of h0l layers collected at an SDD of 493.7 mm, an incident angle of 0.03° and an X-ray energy of 74 keV, with detector gaps filled (HE-GID). (b) Reconstruction of h0l layers collected at an SDD of 143 mm, an incident angle of 2° and an X-ray energy of 15.9 keV (ME-GID). Here, the detector gaps are not filled. The magnified insets show the corresponding reflection environments from the two experiments. In these insets, the HE-GID recorded [\overline{3} 00] pattern reveals both the absence of the first-order ring shown with arrow 1 and the presence of a weak second-order ring shown with arrow 2, whereas most of the ME-GID 300 environment is heavily shadowed by the substrate, making it impossible to observe such details.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1417-1427
https://doi.org/10.1107/S1600576725005837
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