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![[Figure 4]](gue5004fig4mag.jpg)
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Figure 4
(a) Reconstruction of h0l layers from a ϕ scan collected with an X-ray energy of 15.9 keV at an incident angle of 2° and an SDD of 143 mm. The strong background in the reconstruction especially prominent at high diffraction angles is due to fluorescence scattering. (b) Merging of a high-resolution ϕ-scan reconstruction and an ω-scan reconstruction that is absorption corrected and scaled to ϕ. Both scans were collected with 12.8 keV and at an incident angle of 2° and an SDD of 241 mm. The region indicated with a blue outline shows the coverage of the ω-scan reconstruction. Note that the grayscale contrast of the merged reconstruction has been lowered to show the overlap better. Panel (b) is not a magnified view of panel (a), but a reconstruction from measurements at different wavelengths in the range indicated by the boxed region of panel (a). The merging of ϕ and ω scans at 12.8 keV is shown in the inset as the ω scans at 15.9 keV were not measured. |
![[Figure 4]](gue5004fig4.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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