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Figure 12
Data from a Mythen detector: the raw data (above) show spurious features, but appropriate correction for flatfield and angular calibration results in the correct pattern (below). The most affected parts of the patterns are encircled. The result of these errors if not corrected would be a noisy, non-statistical background, the presence of spurious features and non-corrected intensities of the peaks, leading to data unusable for structure solution, quantification and even fingerprinting.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1085-1105
https://doi.org/10.1107/S1600576725004728
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