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Figure 2
Synchrotron XRD pattern of the studied illite. Experimental data are shown in black, and the calculated pattern from Rietveld refinement is shown in red. The gray line below the patterns represents the residual difference between the experimental and calculated data. The inset in the upper right corner shows a magnified view of the 2.5–5 Q region. Indices (hkl) corresponding to the 1Mtv illite structure are indicated. The goodness-of-fit is 7.15%.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1185-1190
https://doi.org/10.1107/S1600576725004170
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