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Figure 13
Matrix of averaged 2D [2 {\overline 2} 0 2] intensity profiles from the cluster 7 area. Each profile is the averaged map of all sampling points from the same SC. The coloring of the 2D profiles is based on logarithmic intensity. (a)–(c) Columns of raw 3D diffraction patterns projected onto 2D space. Columns (a), (b) and (c) in the matrix are for ω–2θ, 2θ–φ and ω–φ spaces, respectively. Each row of the profiles is labeled according to the UMAP cluster map in Fig. 12. For each image, a white crosshair is used as a guideline to help determine the positions of the diffraction peaks. Because of the zone plate in the optical system of nanoXRD, two separate peaks are observed along the φ direction. The values of φ are relative since a reference diffraction point along the φ direction is not given.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1205-1219
https://doi.org/10.1107/S1600576725004169
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