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Figure 3
UMAP ability on synthesized 1D nanoXRD profiles with varying continuity. We synthesized the distribution of (a) strain and (b) FWHM and peak height versus X position. Selected points are marked in panels (a), (b) and (d). We insert a new strain state at X ∈ [6 µm, 13 µm]. (c) Sampled XRD profiles at selected positions. (d) UMAP plot of reduced 1D nanoXRD profiles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1205-1219
https://doi.org/10.1107/S1600576725004169
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