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Figure 8
(Right) Matrix of representative 2D [2 {\overline 2}02] intensity profiles at X = 25 µm positions along the Y direction in (a) the UMAP cluster map. (b)–(d) Columns of raw 3D diffraction patterns projected onto 2D space. The coloring of each profile is based on logarithmic values of intensity. Column (b) in the matrix is for ω–2θ space, column (c) is for 2θ–φ space and column (d) is for ω–φ space. Each row of the profiles is labeled according to the UMAP cluster map shown in panel (a). For each image, a white crosshair is used as a guideline to help determine the positions of the diffraction peaks, and black arrows are used to indicate the peak positions. Because of the zone plate in the optical system of nanoXRD, two separate peaks are observed along the φ direction. The values of φ are shown to be relative since a reference diffraction point along the φ direction is not given.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1205-1219
https://doi.org/10.1107/S1600576725004169
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