view article
Figure 9
(Right) Matrix of representative 2D [2 {\overline 2} 00] intensity profiles at X = 25 µm positions along the Y direction in (a) the UMAP cluster map. (b)–(d) Columns of raw 3D diffraction patterns projected onto 2D space. The coloring of each profile is based on logarithmic values of intensity. Column (b) in the matrix is for ω–2θ space, column (c) is for 2θ–φ space and column (d) is for ω–φ space. Each row of the profiles is labeled according to the UMAP cluster map shown in panel (a). For each image, a dark crosshair is used as a guideline to help determine the positions of the diffraction peaks, and dark arrows in panels (b) and (d) indicate how the diffraction patterns shrink or broaden in the ω direction, while dark arrows in panel (c) emphasize the movement in the φ direction. Red arrows in panel (b) mark the position of a minor structure near the peak. Because of the zone plate in the optical system of nanoXRD, two separate peaks are observed along the φ direction. The values of φ are relative since a reference diffraction point along the φ direction is not given.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1205-1219
https://doi.org/10.1107/S1600576725004169
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS