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Figure 10
(a) The calculated diffracted intensity profile (in red) from the OPB model described in the main text, using the `modified Hervoches' positions for the Bi atoms listed in Table 2[link], compared with the background-subtracted experimental XRD data points (blue dots) taken from the epitaxial BiT thin film represented by the TEM images in Figs. 2[link] and S1. Plots (b), (c) and (d) represent expanded views of the model/data comparison for the 004, 006 and 0 0 12 reflections, respectively.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1191-1204
https://doi.org/10.1107/S1600576725004091
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