view article

Figure 8
The observed distribution of 85 inter-OPB lengths measured from TEM images of a thin-film sample of BiT, plotted as fractions of lengths observed in a group 10 nm wide, centred at 10 nm intervals, compared with a gamma distribution function (see main text) using [\alpha] = 10, [\beta] = 0.26 and K = 10. The mean value of L was set to 38 nm, which gives a mode of 34.2 nm and a standard deviation of 12.0 nm. The error bars indicate the widths of the groups (±5 nm) and the estimated error in the number fraction in each of the groups (±20%).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds