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Figure 9
(a) Top (black): the diffraction profile for a 90%-oriented BiT film calculated using CrystalMaker7 for the structural data reported by Hervoches & Lightfoot (1999BB20) – the reflection peak Miller indices are indicated above the plot. Bottom (blue dots): the XRD data collected using monochromated Cu Kα radiation from the epitaxial BiT thin film represented by the TEM images in Figs. 2[link] and S1. (The data have been edited to eliminate substrate peaks for clarity of presentation.) (b) Top (black): the diffraction profile for a 90%-oriented BiT film calculated using CrystalMaker with the modified Bi atomic positions presented in the main text. Bottom (blue dots): XRD data as for (a).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1191-1204
https://doi.org/10.1107/S1600576725004091
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