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Figure 1
Schematic of the experimental setup (not to scale), showing a suspended ZnO NW and a corresponding experimentally measured Laue microdiffraction pattern. The inset shows a SEM image of a suspended ZnO NW crossing a Si micro-trench and being fixed at both ends by electron-beam-induced deposition of Pt.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1149-1158
https://doi.org/10.1107/S1600576725003668
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