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Figure 11
(a) Detail of an HR-TEM image showing two small dislocation loops in close basal planes. The local thickness of the sample, derived from image simulation of a defect-free region of the sample close to the observed region (see Fig. 1.5 in the supporting information), is estimated to be 17.2 nm. (b) Multislice simulation showing the local contrast variations produced by two dislocation loops with Burgers vectors b = 1/3[11[\bar{2}]0] in a similar configuration to that observed in the experimental image (t: 17.2 nm; C1: −12 nm; C3: −7 µm). The simulation does not take into account the slight misorientation of the sample with respect to the 〈11[\bar{2}]0〉 crystallographic axis as seen in the experimental image.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1149-1158
https://doi.org/10.1107/S1600576725003668
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