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Figure 2
Applied force as a function of the displacement of the piezoelectric stage carrying the Si cantilever inferred from the rotation angle of the Si lattice planes of the SFINX tip (illustrated in the schematic above).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1149-1158
https://doi.org/10.1107/S1600576725003668
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