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Figure 7
(a) Assembly of bright field (BF) TEM images of the plastically deformed ZnO NW, observed in cross section, with accompanying schematic showing the key parts. (b) Higher-magnification BF image of the area marked by a square in the top image. This zone, located at the edge of the trench, contains numerous extended defects.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1149-1158
https://doi.org/10.1107/S1600576725003668
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