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Figure 5
(a) Transmission and (b) DF X-ray images of AAO wafers with different pore sizes. (c) and (d) One-dimensional SAXS azimuthal integrations, (c) on a logarithmic scale as a function of q and (d) on a linear scale as a function of distance from the beam centre to represent SAXS beam broadening. The sample-to-detector distance is 2500 mm for all measurements

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025|
https://doi.org/10.1107/S1600576725004017
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