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![[Figure 2]](xx5076fig2mag.jpg)
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Figure 2
(a) Scattering geometry for GIXD measurements with an area detector. The incident X-ray beam is fixed and follows the axis y. The sample is mounted on a goniometer and can be rotated around its surface normal through φ. The angle of incidence α of the primary X-ray beam on the sample is adjusted by tilting the sample around x. (b) Intersection of the Ewald sphere (gray) with the crystallite orientation sphere (schematically shown in red) under grazing-incidence conditions. |
![[Figure 2]](xx5076fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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