A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction

Gasser, F.; John, S.; Smets, J.; Simbrunner, J.; Fratschko, M.; Rubio-Giménez, V.; Ameloot, R.; Steinrück, H.-G.; Resel, R.

doi:10.1107/S1600576725004935

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
Measured GIXD data of an anthraquinone thin film presented in (a) cylindrical reciprocal-space coordinates $[({{q_{xy}},{q_{z}}} )]$ and (b) spherical reciprocal-space coordinates $[({\psi, q} )]$ . The white, red and orange lines indicate the integration limits q_i^min and q_i^max used to compute the radial line profiles $[I_i^{{\rm{obs}}}(\psi )]$ . Data above and below the limits are used to perform a local background correction of each radial line profile. (c) Radial line profile $[I_1^{{\rm{obs}}}(\psi )]$ obtained after background correction and numerical integration between q₁^min and q₁^max. The individual data points along a radial line profile are indexed with j.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 4| August 2025| Pages 1288-1298

https://doi.org/10.1107/S1600576725004935

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