A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction

Gasser, F.; John, S.; Smets, J.; Simbrunner, J.; Fratschko, M.; Rubio-Giménez, V.; Ameloot, R.; Steinrück, H.-G.; Resel, R.

doi:10.1107/S1600576725004935

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 4
Measured GIXD patterns of anthraquinone thin films prepared by dip coating with withdrawal velocities of (a) 1 µm s⁻¹ and (e) 2 µm s⁻¹. From the measured GIXD data, radial line profiles were extracted at (b), (f) $[q \in [1.587, 1.697]]$ Å⁻¹, (c), (g) $[q \in [1.830, 1.910]]$ Å⁻¹ and (d), (h) $[q \in ]$

Å⁻¹. Calculated line profiles are shown as red lines. The results of the quantitative texture analysis assuming three contact planes are given in the respective legends. Theoretical Bragg peak positions corresponding to the different contact planes are indicated by colored lines below the radial line profiles.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 4| August 2025| Pages 1288-1298

https://doi.org/10.1107/S1600576725004935

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page