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Figure 5
Measured GIXD patterns of ZIF-8 thin films prepared by molecular layer deposition on (a) a bare silicon substrate and (c) a substrate functionalized with a self-assembled monolayer of ODT molecules. The solid white lines indicate the integration limits for the extraction of radial line profiles. The blue circles correspond to calculated peak positions assuming a (001) contact plane. Extracted radial line profiles for the sample prepared on (b) bare silicon and (d) an ODT-functionalized substrate are fitted assuming a thin film consisting of unoriented (blue) and preferentially oriented crystallites (red). Bragg peaks of the oriented fraction are indexed with their Laue indices.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1288-1298
https://doi.org/10.1107/S1600576725004935
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