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Figure 1
(a) Schematic diagram of the semi-automated Serial(P)ED experiment workflow. (b) An example of a STEM-HAADF reference image and the respective PED patterns acquired at each of the areas marked in red.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1249-1260
https://doi.org/10.1107/S1600576725005606
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