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Figure 2
Representative reference images used to select interesting BaSO4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. (a) STEM-HAADF image from the JEOL F200 TEM at 200 kV. (b) STEM-BF image from the TESCAN Tensor microscope at 100 kV.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1249-1260
https://doi.org/10.1107/S1600576725005606
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