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Figure 7
Dynamically refined structure models of baryte projected along b from precessed (a) serial and (b)–(c) tilt-series 3D ED data. Diffraction data collected on the F200 microscope on the same TEM grid, under the same illumination conditions and with the same detector parameters. The model in panel (b) was obtained from 121 diffraction patterns expanding 120° of angular range, while the model in panel (c) corresponds to 101 patterns across 100°.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1249-1260
https://doi.org/10.1107/S1600576725005606
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