view article
Figure 11
(a) EDX surface analysis and (b) STEM cross section with EDX elemental mapping for a Cu 4 at.% Nb film.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 1995-2005
https://doi.org/10.1107/S1600576725008131
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS