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Figure 12
(a) EDX surface analysis and (b) STEM cross section with EDX elemental mapping for a Cu 11 at.% Pd film.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 1995-2005
https://doi.org/10.1107/S1600576725008131
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