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Figure 5
XRD diffractograms around the Cu 111 reflection of Cu films with different Pd at.% concentrations. The solid lines are the fit using the model presented in the main text. The diffraction curves are in linear scale and have been vertically shifted for clarity. Where indicated, they have also been multiplied by 20.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 1995-2005
https://doi.org/10.1107/S1600576725008131
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