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Figure 1
Schematic of the scattering geometry assuming a systematic error given by the sample and beam not coinciding with the COR. The X-ray beam is much smaller than the polished extended crystal face, from which X-ray reflectivity is to be determined. The angle of incidence (θ) is scanned and it is evaluated at which positions (x,z) point P can be brought into the beam. The COR of the θ axis is indicated by the black marker and the (misalignment) offset distances of the beam and sample are given as [\Delta z_{\rm b}] and [\Delta z_{\rm s}], respectively. The origin of [z_{\rm L}] lies at the COR and its positive direction is indicated. Shown are the situations of a perfectly rigid set-up (Case1) and (in the inset) the assumption that the sample moves laterally with angle θ due to a change in the weight distribution (Case2), as indicated by the components of the gravity force ([F_{\rm g}]) and as explained in the main text. The y axis is perpendicular to the drawing plane.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 1978-1985
https://doi.org/10.1107/S1600576725008179
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