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Figure 1
(A) Light transmission of different viscous jetting materials measured in flat cells of 22, 100, 200 and 500 µm path lengths using an integration sphere detector and fitted with the Kubelka–Munk model. (B) Exemplary forward light flux I(x) and backward light flux J(x) simulated for a 150 µm-thick sample layer using the Kubelka–Munk theory.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 2078-2089
https://doi.org/10.1107/S1600576725009562
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