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Figure 7
Efficiency of the AI-PhaSeed method as a function of data resolution cut-offs, compared with the efficiency obtained using random phase and true phase seeds. Five datasets were analysed: no resolution cut (no_cut), and cut-offs at 1.0, 1.2, 1.4 and 1.6 Å resolution. Error bars represent the propagated uncertainty, calculated as [\delta E = E\left( {{1 / N} + {1 / D}} \right)^{1/2}], where E is the efficiency (%), D is the number of correctly classified structures and N is the total number of structures.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 1859-1869
https://doi.org/10.1107/S1600576725008271
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