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Figure 9
Efficiency of the DM and DM+AI-PhaSeed methods when applied to Class 0 and Class 1 test structures, plotted as a function of applied resolution cut-off level. Five different datasets were compared: no resolution cut (no_cut) and cut-offs at 1.0, 1.2, 1.4 and 1.6 Å resolution (Class 1 corresponds to MPEseed ≤ Q1 and CORRseed ≥ Q3, and Class 0 to MPEseed > Q1 and CORRseed < Q3). Error bars are also shown.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 1859-1869
https://doi.org/10.1107/S1600576725008271
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