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Figure 1
(a) WAXS pattern of randomly oriented graphite flakes showing concentric diffraction rings indexed to their corresponding crystallographic planes. (b) Azimuthally integrated diffractogram plotted as scattering intensity versus scattering vector magnitude q. The inset shows the same diffractogram plotted as a function of interplanar spacing d. The scattering features and the integrated diffraction pattern were indexed according to the corresponding crystallographic planes of graphite.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 2105-2111
https://doi.org/10.1107/S1600576725008714
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