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![[Figure 2]](uu5016fig2mag.jpg)
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Figure 2
WAXS patterns for a single graphite flake aligned in (a) a face-on configuration, such that its basal planes were nearly perpendicular to the incident X-ray beam, corresponding to the [001] zone axis parallel to the beam, and in (c) an edge-on configuration, such that its basal planes were nearly parallel to the beam, corresponding to the [100] zone axis perpendicular to the beam. The corresponding scattering features are indexed according to the graphite crystal family reflections. Panels (b) and (d) display the azimuthally integrated diffraction profiles from the regions containing the indexed scattering features, plotted against the scattering vector magnitude q. The inset scanning electron micrographs show face and edge perspective views of the graphite flake for better clarification of the face-on and edge-on settings; their scale bars represent 500 and 1 µm, respectively. The red arrows indicate the direction of the incident X-ray beam. |
![[Figure 2]](uu5016fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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