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Figure 3
(a) Normalized intensity from the X-ray scattering signal as a function of the azimuthal angle φ, obtained by azimuthal integration of the scattered intensity I(φ). The data correspond to scattering patterns of a graphite flake oriented (b) near the [001] zone axis, with its basal planes perpendicular to the incident X-ray beam, and (c) near the [100] zone axis, with its basal planes parallel to the beam. At the bottom, the corresponding values of S and 〈cos2φ〉(hkl) are listed for the cases where a crystallographic plane is oriented with respect to the incident beam.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 2105-2111
https://doi.org/10.1107/S1600576725008714
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