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Figure 4
WAXS pattern of a GO paper ball exhibiting random in-plane and out-of-plane flake orientations. (a) Scattering features appear as continuous rings, indicating a lack of preferential alignment within the sample. (b) The corresponding integrated diffraction pattern as a function of the scattering vector magnitude q. The inset in (b) shows the same azimuthally integrated pattern plotted against the interlayer spacing d in ångströms. No crystallographic indexing is applied, except for the in-plane (100) graphite reflection, which is commonly observed in disordered graphene oxide systems.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 2105-2111
https://doi.org/10.1107/S1600576725008714
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