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Figure 4
Normalized peak intensities of selected Bragg peaks as a function of beam energy around the Sn K edge for (a) CsSnBr3 and (b) CsSn0.5Pb0.5Br3 thin films, and around the Pb LII edge for (c) CsPbBr3 and (d) CsSn0.5Pb0.5Br3 thin films. Thick coloured lines are simulated data (Marstrander & Moller, 1966View full citation; Merrit, 2023View full citation), assuming a random mixture of tin and lead. Darker markers with thin lines are experimental data. Coloured numbers in the graphs indicate the Miller indices of the respective diffraction peaks. Corresponding data on more diffraction peaks for both edges can be found in the supporting information in Fig. S1, while reciprocal-space maps for corresponding compositions are shown in Fig. S2.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 6| December 2025| Pages 2125-2133
https://doi.org/10.1107/S1600576725009951
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