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Figure 1
(a) Schematic diagrams of the side and top views of a van der Waals FGaT crystal. (b) XRD pattern along the normal face. (c) A photograph of the crystals as grown. (d) X-ray Laue image and (inset) photograph of the crystal used in neutron diffraction. (e) Temperature-dependent out-of-plane and in-plane magnetic susceptibility measurements under FC and ZFC conditions at 1000 Oe for bulk FGaT. (f) Out-of-plane magnetic hysteresis curves measured by vibrating sample magnetometry at 2 and 300 K.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 809-815
https://doi.org/10.1107/S160057672600230X
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