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Figure 1
Demonstration of defining TOF filtering limits automatically on the basis of a TOF–wavelength McStas monitor (top) and a wavelength of interest (6.0 Å). The relevant wavelength bin containing the wavelength of interest is retrieved and fitted by a Gaussian function to find the FWHM limits (bottom).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 827-836
https://doi.org/10.1107/S160057672600213X
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