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Figure 2
Comparison of simulated reflectivity curves for a GaAs substrate, assuming Cu Kα1 radiation. The curves have been calculated using the dynamical approach and are compared with the Parratt formalism as implemented in GenX. The inset provides a detailed comparison for angles below the total reflection.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 968-977
https://doi.org/10.1107/S1600576726002566
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