view article
Figure 3
X-ray diffraction pattern of a 105 Å thick V layer on an MgO (001) substrate. The pattern was previously published by Komar & Jakob (2017View full citation) with a simulation of the diffraction pattern created with CADEM. This simulation is displayed in blue. A fit of the data with GenL is shown in red. The corresponding strain profile, i.e. the out-of-plane lattice parameter c as a function of the number of unit cells counting from the substrate interface, is displayed as an inset.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 968-977
https://doi.org/10.1107/S1600576726002566
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS