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Figure 7
X-ray diffraction pattern around the W (110) Bragg peak of a 100 Å thick W layer grown on an Al2O3 (Mathematical equation) substrate. A fit of the data with GenL taking roughness into account as well as modeling intensity originating from the substrate is shown in red.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 968-977
https://doi.org/10.1107/S1600576726002566
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