view article
Figure 8
X-ray diffraction pattern around the Fe (002) Bragg peak of a 100 Å thick Fe layer grown on an MgAl2O4 (001) substrate. Fits of the data with GenL taking tensile out-of-plane strain and a bct Fe/bcc Fe bilayer layering into account are shown in blue and red, respectively. The fitted strain profiles, i.e. the evolution of the interplanar spacing d over the number of atomic layers n, are displayed in the inset in their respective colors.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 968-977
https://doi.org/10.1107/S1600576726002566
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS