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Figure 2
Fitting results for (a) and (b) the h-PS/bis-PCBM and (c) and (d) the d-PS/FBR samples. These are typical measurements and fits during an in situ annealing process. (a) and (c) Experimental data and corresponding fits. Blue points show the measured reflectivity data, the red and orange curves are calculated for the parameters predicted by reflectorch (red) and subsequently polished by least-squares fitting (orange), and the green curve is calculated for the parameters extracted by refnx. (b) and (d) SLD profiles corresponding to the parameters extracted by reflectorch and refnx. Panels (a) and (c) are shown on an R(q) q4 scale in Figs. S2 and S4, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 765-773
https://doi.org/10.1107/S1600576726002657
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