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![[Figure 2]](xx5095fig2mag.jpg)
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Figure 2
Simulated reciprocal-space maps of (a)–(d) 002 and (e)–(f) 003 diffraction maxima with (a) and (e) only chemical contrast included, (b) and (f) only strain included, (c) and (g) both chemical contrast and strain included, and (d) and (h) chemical contrast, strain and mosaicity included. The parameters of the random distribution of concentration are σ = 0.05, α = 1 and ξ = 1 nm, and the mosaic block size in (d) and (h) is R = 5 nm. |
![[Figure 2]](xx5095fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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