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Figure 1
XRD θ–2θ scans (in logarithmic scale) of Cu/Mo NMLs grown on sapphire (0001) substrate.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 910-922
https://doi.org/10.1107/S1600576726003638
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