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Figure 11
Comparison of the in-plane reciprocal-space maps of the reference sample (left, deposition temperature 420°C) and the sample with increased deposition temperature (right, 700°C). The L value is a summation between 0.02 and 0.1 [r.l.u. SrTiO3(001)]. The dark regions on the right-hand side are artefacts caused by the overlap of the individual detector images.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 889-900
https://doi.org/10.1107/S1600576726003316
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