Epitaxy of ultrathin Fe3O4 films on SrTiO3(001): influence of growth parameters on the formation of coexisting (111)- and (001)-oriented phases

Alexander, A.; Ruwisch, K.; Thien, J.; Weissbach, A.; Pollenske, T.; Zhang, B.; Schulte, F.; Gutowski, O.; Vlad, A.; Coati, A.; Wollschläger, J.

doi:10.1107/S1600576726003316

Journal of Applied Crystallography Journal of Applied
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Figure 15
Sections of the recorded HEXRD reciprocal-space map for all four samples. The dark rectangles at the positions of the SrTiO₃ reflections are caused by beamstops used to protect the detector from the substrate's bright Bragg reflections.

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 3| June 2026| Pages 889-900

https://doi.org/10.1107/S1600576726003316

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