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Figure 16
(a) Determination of the vertical (blue) and lateral (red) lattice constants for the high-temperature sample. By plotting the fitted reflection positions against their nominal positions, the ratio of the lattice constants of the film and substrate can be obtained from the slope (dashed line). (b) Lateral and vertical lattice constants a|| and a⊥ versus the crystalline layer thickness dcryst of Fe3O4(001) determined from the fit in the HEXRD measurements. For comparison, the vertical lattice constants a⊥ determined from the difference of the reflections on the (22)cub-CTR are also plotted. The black dashed line denotes the value for bulk Fe3O4.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 3| June 2026| Pages 889-900
https://doi.org/10.1107/S1600576726003316
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