view article
Figure 1
Sample and measurement procedure. (a) Illustration of the lamella and focused beam. (b) The measurement procedure of one area. One scan consists of 20 lines measured continuously. The 100 nm vertical steps give a line distance of 40 nm as the beam is 60 nm in this direction, as shown in the green rectangle. (c) Illustration of a section of the PAA sample (NW: nanowire).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026|
https://doi.org/10.1107/S1600576726004620
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS